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12.7 Thermal test in regard to fault conditions in lamp controlgear or electronic* M" ]& i) Q# t) F; K0 o" t$ e
devices in plastic luminaires
/ }# A4 S! P9 m }: I0 iThe test applies only to luminaires with a thermoplastic housing not fitted with an extra
/ F9 f0 {8 e5 `. H1 tmechanical temperature-independent device as per 4.15.2.
( W1 b r7 y+ l" N2 F
6 _1 x2 I' ?* i9 Y12.7.1 Test for luminaires without temperature sensing controls
0 a) z5 i5 Q1 H: a4 J% TThe luminaire shall be tested under the conditions specified in items a), c), e), f), h) and l) of
$ w. P% k# [- G. j& ?/ ~12.4.1. In addition, the following also applies.# Q" l( i0 R5 G4 m" N
20 % of the lamp circuits in the luminaire, and not less than one lamp circuit, shall be$ D; ~' Q6 k; r; r6 S/ Y+ u
subjected to abnormal conditions (see item a) of 12.5.1).- Z0 _6 Z3 k4 E- _, Y
The circuits which have the most thermal influence on the fixation point and exposed parts
* X: s# ]: m7 U4 Rshall be chosen and other lamp circuits shall be operated at rated voltage under normal
$ h# V" z$ F3 p0 f$ J- b% [5 j+ Pconditions.% Z \0 j, {6 x+ I" H' d
The circuits subjected to abnormal conditions shall be operated at 1,1 times (the rated voltage
r0 n& ?1 a7 n }0 `1 R6 V! qor the maximum of the rated voltage range). When conditions are stable, the highest winding
! @0 [% S5 a3 K/ U, Z# H! S$ `temperature and highest temperature of fixing points and most thermally influenced exposed2 O' S3 l2 [7 x ~
parts shall be measured. It is not necessary to measure the temperature of small wound. Y2 C* T! x1 V8 X, B# M
devices that are incorporated within electronic circuits.: T1 A8 a0 b9 H9 b6 Y( C8 v
Compliance$ H. ]5 ]1 a" T3 e; c l3 Q
The values of the ambient temperature and the temperature measured at 1,1 times (the rated
3 z! ^3 B2 R' p6 bvoltage or the maximum of the voltage range) are used for the linear regression formula in
9 |, {' K, K& Z' x; V9 V( ecalculating the temperature of fixing points and other exposed parts in relation to a; X9 h: x T |! r) T* D1 N" Y- G' S
ballast/transformer winding temperature of 350 °C. The calculated value shall not exceed the8 y" `' X7 E5 l8 f: Q
temperature of the deflection under load of the material in accordance with method A as8 Y) h/ L+ \( p0 C* v0 F
defined in ISO 75 (1987), Plastics and ebonite – Determination of temperature of deflection# Z/ b$ Q4 Y! b) G
under load.
3 `# I8 S/ H8 O; z2 Y! w12.7.2 Test for luminaires with temperature sensing controls internal/external to the
, J. W$ f8 Z: k6 z* k2 {. Q& Gballast or transformer
" c' d$ c. d. |7 i0 W* [/ mThe luminaires shall be set up for this test as described in the first three paragraphs of 12.7.1.
8 X+ I s. ]$ r* Q% E. \5 i5 `6 S2 \& K1 Y
The circuits subjected to abnormal conditions shall be operated with a slowly and steadily
3 U, w3 u0 b$ I2 _* Q: u6 u8 Nincreasing current through the windings until the temperature sensing control operates.8 [/ n- [4 S( _
Time intervals and increments in current shall be such that thermal equilibrium between9 Z* J- S! H3 u- {
winding temperatures and temperature of fixing points and most thermally influenced exposed! t) r7 ~8 V6 v5 [1 [- ?2 ^
parts is achieved as far as is practicable. During the test, the highest temperature of the spots
1 a8 b. P/ [) D; |. ztested shall be continuously measured.
. E7 {/ d4 F: R" l8 x4 @For luminaires fitted out with manual-reset thermal cut-outs, the test shall be repeated six
/ W4 `4 ~2 Y" x0 A& H, Ntimes allowing 30 min intervals between tests. At the end of each 30 min interval, the cut-out
' J( C4 {5 P: Lshall be reset.
4 J/ p8 R9 k4 z; Q& M$ x1 BFor luminaires fitted out with auto-reset thermal cut-outs, the tests shall be continued until a
) W- y6 D& r4 K" R3 |8 q9 \: ]stable temperature is achieved. p9 F6 p, F* W5 z
Compliance
8 K, t0 [' ^/ @% e5 lThe highest temperature of the fixing points and most thermally influenced exposed parts,- F; s$ R8 z. ~' M8 J: z% \
shall not exceed the temperature of deflection under load of the material according to the# U2 k, J w# O, ?; f! s
method A as defined in ISO 75, at any time during the tests for thermal links, manual-reset
- Q! S. C; k! U" d- [6 Z" `thermal cut-outs, and auto-reset thermal cut-outs.
8 m2 S9 d0 e2 l/ A3 jIn applying the requirements of 4.15 and 12.7 the following notes are to be referred to:) L+ G+ P/ f2 H. ]. k! V
NOTE 1 - ‘Fixing points’ means both the fixing points of components and the fixing points of a luminaire to the
- N- [$ P5 J$ N! A- Kmounting surface.
* A8 ^& I& u t7 [9 [
2 q) o' P# k |2 I {) N% j% CNOTE 2 - ‘Exposed part’ means the outer surface of the luminaire enclosure.% x9 P( V, w: |' I1 J
NOTE 3 - Measurement of exposed parts is restricted to those parts providing the luminaire/component fixing or
7 D$ L i! J$ I; |2 l9 `+ cparts providing a protective barrier against accidental contact with live parts, as required by section 8 of this
! U, T( z2 Z! k; j/ d H estandard.
! g u3 \% F9 xNOTE 4 - The hottest part of the thermoplastic material section requiring test is measured. This may often be on3 P4 q$ b5 w/ ?3 Z% r
the internal surface of a luminaire enclosure not the outer surface.6 l4 t* s2 y3 {2 |
NOTE 5 - The material temperature limits defined by clause 12.7 are with respect to materials under both
9 d$ z: ^, R$ Tmechanical load and no mechanical load.
1 s9 R9 q, q; I% b. @7 }% @NOTE 6 - The application of clause 12.7 must be read together with the requirements of sub-clause 4.15. |
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