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由于我的标准上有公司名字，就不直接贴上了，差异部分如下
0 ]/ l# e6 ], |6 N
1 z8 ~$ q) K/ ~. gPage 9
9 t y" S5 \- A0 t$ y/ N/ R1 Scope and object( t* q9 W2 P4 Z4 s w
Replace the title of this clause by “Scope”1 F. A3 g7 k/ f6 ]. b4 ]; }
1.1 In the third paragraph, replace “CISPR 14” by “CISPR 14-1”.
9 [- d! T8 k" i6 N$ DPage 117 u& R% Z% P3 f4 Y5 I- F6 x
2 Normative references
' H- N: W4 w4 t, K; O* \$ n3 |Replace the text by the following:) S! \- x, j$ A' t0 t
The following referenced documents are indispensable for the application of this document.
7 A6 K: A& @* x0 X$ f$ f$ i* mFor dated references, only the edition cited applies. For undated references, the latest edition4 r" ?3 [( J0 D8 z
of the referenced document (including any amendments) applies.; v3 S% q9 W; g/ P+ L' P
IEC 60050-161, International Electrotechnical Vocabulary (IEV) – Chapter 161:& _7 @, ^, U' D& o) e
Electromagnetic compatibility+ `; r/ i% n, y
$ _, l1 t$ n* g
s; D* f+ q. K: |CISPR 14-2 Amend. 2 © IEC:2008 – 3 –3 K" z5 d5 v/ Q0 f- j% j1 j. x, p' m O
IEC 61000-4-2:1995, Electromagnetic compatibility (EMC) – Part 4-2: Testing and) ?7 |, M) q: L6 T1 q, Q* T" t8 M) {
measurement techniques – Electrostatic discharge immunity test( b% d! L! D3 s# ?& e. q: G4 ?' M
Amendment 1:1998
/ w/ |* r i- F3 u% uAmendment 2:20001
3 b1 f$ q* a5 O9 WIEC 61000-4-3:2006, Electromagnetic compatibility (EMC) – Part 4-3: Testing and
1 U7 c( @+ Q" P. I9 O! y5 ^2 g* [1 ]measurement techniques – Radiated, radio-frequency, electromagnetic field immunity test
# f; K+ e( T8 _. e# bAmendment 1:200723 i! v$ d* F& Z F. V& R1 e
IEC 61000-4-4:2004, Electromagnetic compatibility (EMC) – Part 4-4: Testing and
% K. k2 y1 Z* E8 X- H3 i# Mmeasurement techniques – Electrical fast transient/burst immunity test
4 A' ?' E. N$ O+ N) JIEC 61000-4-5:2005, Electromagnetic compatibility (EMC) – Part 4-5: Testing and0 b8 Z& ]: t3 _+ m
measurement techniques – Surge immunity test
0 S5 R& z+ d2 eIEC 61000-4-6:2003, Electromagnetic compatibility (EMC) – Part 4-6: Testing and
. `' e+ A6 j; p( xmeasurement techniques – Immunity to conducted disturbances, induced by radio-frequency
1 y( X7 t3 Z* S+ u5 _+ |fields7 x4 W: P V7 A
Amendment 1:20043 C; m# ^3 z$ Q4 [8 z
Amendment 2:200632 o$ Z) m1 C+ ]& l9 E" K
IEC 61000-4-11:2004, Electromagnetic compatibility (EMC) – Part 4-11: Testing and, L k: J. K' n/ @2 N. h1 U) X( [
measurement techniques – Voltage dips, short interruptions and voltage variations immunity tests
, Q+ z( y$ {" \8 h& WCISPR 14-1:2005, Electromagnetic compatibility – Requirements for household appliances," a; T4 w+ Q4 _
electric tools and similar apparatus – Part 1: Emission
" s6 d7 v3 g: K, sPage 13+ s g) U1 o$ }/ U. W3 N
3 Definitions% z2 a! ?' W7 L' o
Replace the title of this clause by “Terms and definitions”.
/ p$ b& l1 B& y% j( tReplace the first paragraph by the following:0 o: P. e& Z* ]; C/ q
For the purposes of this document, the terms and definitions related to EMC and related2 e1 j, G8 y& D/ w2 }1 A* j
phenomena found in IEC 60050-161, as well as the following terms and definitions apply.
2 F* z( ]8 Z+ x$ s2 x( j2 g. ~$ _Add the following new definition:
8 O0 \* }% A, X- l* J# Q" f$ Z3.18
" C$ Q7 H/ [5 zclock frequency& {/ A z' Q5 j
fundamental frequency of any signal used in the device, excluding those which are solely
" Y+ q6 Y* g0 w$ J$ M# [used inside integrated circuits (IC), ^3 p4 v3 z" t
NOTE High frequencies are often generated inside of integrated circuits (IC) by phase-locked-loop (PLL) circuits
& y. c. [* I5 B) O1 m+ L9 C' Gfrom lower clock oscillator frequencies outside the IC.
; _& V* ]& K" ~3 i___________
& B: n' l) l- U$ Q1 There exists a consolidated edition 1.2 (2001) that includes edition 1 and its Amendments 1 and 2.
% ?% L' @0 F5 G% C6 x2 There exists a consolidated edition 3.1 (2008) that includes edition 3 and its Amendment 1.
* i! e2 `: _+ |0 e3 There exists a consolidated edition 2.2 (2006) that includes edition 2 and its Amendments 1 and 2.9 @& d3 w: I2 C( R# K/ z& m* B& W
3 | J3 M: L8 }- K( q' L9 I
1 W. D' O. O$ ^– 4 – CISPR 14-2 Amend. 2 © IEC:2008' C+ i6 h2 }- ]& Z2 c+ D
Page 13
+ G) H/ m4 P X) Q" U0 a4 Classification of apparatus
8 Z. k! X/ N, r% k# b4.2 Delete Note 1 and renumber Note 2, introduced by Amendment 1, as NOTE.
7 d& z- h' l' P; e8 @* r( ^% XPage 151 M, ]* j" ~( N. l1 [1 B! v
5 Tests
" X! D4 W2 s! {$ K: ?$ sThroughout the clause, including the tables, replace “IEC 1000” by “IEC 61000”.' A" x; B% Z. \, d) M& {! J
Page 21# q3 F- h3 q# S8 T( ~' Z
5.6 Surges' d+ {6 t. W, Q
Table 12 – Input a.c. power ports( ^" T8 x9 Y- D( t' h- z0 ^4 `: o1 v
In the second column after 2 kV add "Line-to-Earth with 12 Ω Impedance" and after 1 kV add
7 h9 u0 C9 u9 Q8 E. \. C" g X( O/ N"Line-to-Line with 2 Ω Impedance".
% y" ~/ V- Y1 T7 D) dAfter Table 12, add the following paragraph as a new second paragraph:. f: T( \7 i5 N+ u3 ]4 P+ c) z. L8 |
The positive pulses are applied 90° relative to the phase angle of the a.c. line voltage to the
/ ~0 G& t) S* W" [& p' N2 Y$ Pequipment under test, and the negative pulses are applied 270° relative to the phase angle of4 c% C1 n5 g" {$ P9 h
the a.c. line voltage to the equipment under test. Tests with other (lower) voltages than those2 q% [' t9 l9 T! F: f. } y
given in Table 12 are not required.
! \ e! |' r( ^. Z) h X5.7 Voltage dips and interruptions
3 [ k. p& ~' Q9 {, c3 ETable 13 – Input a.c. power ports$ {6 }8 j5 y5 h: h
Replace the existing Table 13 by the following new Table 13:, k" M* f& a- P+ P8 ~
Table 13 – Input a.c. power ports, a& E; U) Q& e8 ^+ P7 I
Durations for voltage dips
0 u' | W1 j& S P( o: r; L# FEnvironmental Test set-up! _# s8 _" n h: p9 |
phenomena0 E6 E0 X/ c; F' H0 C. _8 v: n- S
Test level7 ?' x i/ {: e
in % UT) p+ m$ ?6 Z, v6 Z% T! W
50 Hz 60 Hz
3 a! _- X5 V) A6 X4 H% t* e6 XVoltage dips+ z% U4 l; v$ T
in % UT( {+ L# j0 _( p+ f
100
+ S; b/ }# G9 |. s D60# g- Y2 R0 r' a7 k' p$ \9 E
30& p/ \9 e1 h' S' K7 s) I+ c
0
; }, T& h. u7 E; M40
& l& C6 C# D; t$ v9 G70
' S% `: q* j, H. O9 ?: ]( s" A6 R+ o0,5 cycle
* J/ E- X) v/ P U: c* F% C10 cycles
6 Y) Q6 g& n" b( J' }) S25 cycles
" X9 @1 X$ j+ ^0,5 cycle$ A g5 c/ k+ B8 U
12 cycles- ?- f( W" ]' x; o {
30 cycles
. y$ K. q" p1 \8 w5 SIEC 61000-4-11
; o0 B$ F+ A- j) l" ^ dVoltage change shall# J9 n; i7 ]( X, l+ I
occur at zero crossing
; b5 ^8 M! h/ T: C( u" @UT is the rated voltage of the equipment under test.
& W8 j' X9 z$ k: F0 h$ d8 D' _& C8 D
4 G- Y# ]5 s) i/ o: J5 s( fCISPR 14-2 Amend. 2 © IEC:2008 – 5 –" i4 d6 ^) |8 j! b+ ?+ F
Page 27
# J) j1 ]4 t t) w+ A! R8 Conditions during testing
) u9 m- b4 c" m4 C* `8.1 Replace the first paragraph by the following paragraph:) m. J: C. R8 h
Unless otherwise specified, the tests shall be made while the apparatus is operated as, R3 |- J0 K4 W- m* n
intended by the manufacturer, in the most susceptible operating mode consistent with normal b8 U1 `" V* \/ v- j* d
use.8 d: @+ T& o% w5 {( o
8.4 Delete the second sentence.! w. V9 ]4 _! W7 w' w" S
8.7 Delete this subclause.
( _# Q3 T: j( d. B6 U6 Y! N- d8.8 Renumber this subclause as 8.7
6 ?+ x3 V; L* O# Z* D/ S" iPage 29! _+ D7 P: P" A# m8 r
9 Assessment of conformity
7 J- u$ R2 Q/ p$ Q" t9.2 Statistical evaluation: h- G8 s( G1 C7 x+ y& H
Replace the existing Note by the following:" F. p" z( z, t3 L3 ^& U
NOTE For general information on the statistical consideration in the determination EMC compliance, see5 I$ T' J5 U! w W6 x+ [& S1 i
CISPR/TR 16-4-3.! R5 S' g7 m2 V6 j3 l% b& w
Page 31
# x, @' l( C: S# b10 Product documentation
# T/ I6 n6 B0 y2 P/ o/ g5 _4 q5 u9 \Delete this clause.
% y$ B4 n. Z. z4 F3 o/ p* PBibliography
: k3 H+ ]3 a0 j* a' VReplace the reference to CISPR 16-2, introduced by Amendment 1, by the following reference:
! ]2 q8 p* _* A' J% UCISPR/TR 16-4-3, Specification for radio disturbance and immunity measuring apparatus and
% k6 [( ^5 j7 N j- _6 w) G3 M. amethods – Part 4-3: Uncertainties, statistics and limit modelling – Statistical considerations in. p6 K. ]% t8 M& ]
the determination of EMC compliance of mass-produced products (only available in English) |
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