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由于我的标准上有公司名字，就不直接贴上了，差异部分如下: n2 _# i, W: R7 t5 O' _. q1 {
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Page 9, Z, l3 w/ h" R; v' T' H' Q+ b
1 Scope and object6 N; y% O+ f9 T- X q
Replace the title of this clause by “Scope”; @% j$ T1 D* _6 l( I" r0 Y
1.1 In the third paragraph, replace “CISPR 14” by “CISPR 14-1”.# o: \. N" s. {
Page 11+ v$ F# C( A; X6 @; E [/ g
2 Normative references
. C4 k e% D, m" B( P/ NReplace the text by the following:- {; `. i7 @" F1 b
The following referenced documents are indispensable for the application of this document.7 g) ]. U$ `; O7 N' s' s6 j
For dated references, only the edition cited applies. For undated references, the latest edition
4 ^6 M) N/ R; L7 N3 ~4 d7 oof the referenced document (including any amendments) applies./ z9 I& e3 b# P( g* B8 O
IEC 60050-161, International Electrotechnical Vocabulary (IEV) – Chapter 161:
7 y+ {& s3 O, j* WElectromagnetic compatibility
9 p1 a# i, Q% ?
$ o" A1 K9 o6 {+ x2 N+ n% K# d' v) f. S7 ]
CISPR 14-2 Amend. 2 © IEC:2008 – 3 –
7 r* D* ^9 o/ E, j$ BIEC 61000-4-2:1995, Electromagnetic compatibility (EMC) – Part 4-2: Testing and7 _7 r7 {( S0 I
measurement techniques – Electrostatic discharge immunity test0 a8 J: J: C \9 ~ H$ g
Amendment 1:19983 C% H6 G# y( x# l5 i4 O: g+ A
Amendment 2:20001& p T! s" }: U
IEC 61000-4-3:2006, Electromagnetic compatibility (EMC) – Part 4-3: Testing and
8 \: F- B% Q& i! |2 dmeasurement techniques – Radiated, radio-frequency, electromagnetic field immunity test4 q- b% }' h0 f, {4 |
Amendment 1:200723 k; U, l0 F+ r1 ~
IEC 61000-4-4:2004, Electromagnetic compatibility (EMC) – Part 4-4: Testing and4 R& D% i/ `, I1 M6 X$ ^
measurement techniques – Electrical fast transient/burst immunity test/ S7 B" b K" k
IEC 61000-4-5:2005, Electromagnetic compatibility (EMC) – Part 4-5: Testing and
$ [- b- [- R0 ^3 Q+ smeasurement techniques – Surge immunity test
, O& E# y7 ^" J4 z6 \! r* ^+ `IEC 61000-4-6:2003, Electromagnetic compatibility (EMC) – Part 4-6: Testing and
. `+ X- q$ S* H% N6 h. Hmeasurement techniques – Immunity to conducted disturbances, induced by radio-frequency
: e. V% K: c4 U# ^6 Bfields
' ?2 T7 L, m1 ~$ i4 a& aAmendment 1:2004, _) W% d: E3 C5 n" T, T
Amendment 2:20063
/ L4 [2 `! d/ ~& o0 AIEC 61000-4-11:2004, Electromagnetic compatibility (EMC) – Part 4-11: Testing and
W8 F& w3 R: J& j7 H* |measurement techniques – Voltage dips, short interruptions and voltage variations immunity tests
4 k. f" ?# P( iCISPR 14-1:2005, Electromagnetic compatibility – Requirements for household appliances,
% |9 n& Q9 w1 jelectric tools and similar apparatus – Part 1: Emission# W3 C$ [5 D, z( @9 }; }/ D
Page 139 K. C4 E! G. R- O+ a" p5 U
3 Definitions
* L0 C% J u1 t9 d' C! O$ NReplace the title of this clause by “Terms and definitions”.' ^' V. {3 {, W
Replace the first paragraph by the following:$ {) J5 C7 v3 u, S; p2 h/ F! h
For the purposes of this document, the terms and definitions related to EMC and related( A. @8 z6 K* a
phenomena found in IEC 60050-161, as well as the following terms and definitions apply.
( d6 L& [) t" u4 c5 d( QAdd the following new definition:$ [* K T: \7 G
3.18
$ s) V* S ?7 V$ B. Rclock frequency
0 x$ E) k8 Z8 sfundamental frequency of any signal used in the device, excluding those which are solely
! g+ u1 @, y. \8 J/ m/ W& r2 ]! ~+ R) Hused inside integrated circuits (IC)
( X* a' o; x# U+ A ^4 e) r: q; KNOTE High frequencies are often generated inside of integrated circuits (IC) by phase-locked-loop (PLL) circuits8 y; B. Q4 X" P: r
from lower clock oscillator frequencies outside the IC.) S5 n+ D9 h! u( p
___________# p! m7 r4 x8 v# M" R
1 There exists a consolidated edition 1.2 (2001) that includes edition 1 and its Amendments 1 and 2.9 y6 G0 j; P4 h% G
2 There exists a consolidated edition 3.1 (2008) that includes edition 3 and its Amendment 1.
& O# U2 y6 l/ B8 B* F3 There exists a consolidated edition 2.2 (2006) that includes edition 2 and its Amendments 1 and 2.; Q* F' h+ B2 C7 Q2 S
/ Y3 {0 I+ O2 O# I% s2 @0 ^- s) |: _/ ?, g
– 4 – CISPR 14-2 Amend. 2 © IEC:2008' a% X. E' U& Z; z; d# l: x+ v
Page 13 l1 e- I7 a( M8 X9 d. l7 S t
4 Classification of apparatus; S* p$ O( d. ? ]$ i% k7 o7 l
4.2 Delete Note 1 and renumber Note 2, introduced by Amendment 1, as NOTE.
- r( L5 }# _! {) O; BPage 15
+ P( U4 d+ G8 h" I: B7 p5 Tests# ~4 h0 t: V; [* @
Throughout the clause, including the tables, replace “IEC 1000” by “IEC 61000”.
! J5 g; N5 f5 }* G- w, L+ P, d1 |Page 21
3 [& G- u0 O }1 o- V) R5.6 Surges$ m, B7 T. c/ c/ \
Table 12 – Input a.c. power ports+ g% g% a5 L: k/ Z/ l& d
In the second column after 2 kV add "Line-to-Earth with 12 Ω Impedance" and after 1 kV add
6 l' @( B8 c" z0 z( {% b; Z6 S$ Q"Line-to-Line with 2 Ω Impedance".
' Y. S. i$ _7 N8 G, S% AAfter Table 12, add the following paragraph as a new second paragraph:
7 Z: F# E; N. i$ S7 sThe positive pulses are applied 90° relative to the phase angle of the a.c. line voltage to the
1 b1 Y4 Y1 a1 g7 F% H3 j' G% d. requipment under test, and the negative pulses are applied 270° relative to the phase angle of M- s, Y. _8 a$ M: z( j
the a.c. line voltage to the equipment under test. Tests with other (lower) voltages than those
" j% t# N9 _3 z9 @given in Table 12 are not required.
( A1 ] o+ K: a4 P) p5.7 Voltage dips and interruptions, X& g! A. i' l) c1 H6 X
Table 13 – Input a.c. power ports
, F6 k# T) A2 a4 n" ^4 }! BReplace the existing Table 13 by the following new Table 13:& `# B6 @6 x+ T5 Q# H
Table 13 – Input a.c. power ports
% u* f. o2 n8 {) f# v- ZDurations for voltage dips
. ]1 R* A" c; q: P# PEnvironmental Test set-up
/ W. T9 t% B/ d ~phenomena( V" x8 S9 Y+ Q0 I( G
Test level+ N, W8 z2 g# [* m) j
in % UT2 f" L3 d6 t6 `
50 Hz 60 Hz$ L, A: ]& O. R2 h* r6 Z1 h' u
Voltage dips. x- e, Q2 ]- B# t
in % UT
; z, \ \9 e. Q6 R, ]100+ O# F8 |% g7 B# O2 P: Y! A; g6 d
603 g/ V7 p2 t- u
30
) U$ e. f. j6 O/ d0
3 O: c! b5 P) |6 k7 M7 _9 G0 n40& x: s1 z! F0 B$ m3 E( N
70
5 U+ S, d# C5 T1 P& J0,5 cycle& Q' I' q0 y, D* d
10 cycles) Y% `* Z j( O h9 n8 `
25 cycles. ]" b- W0 w4 G5 [- `( S! ` ~5 w
0,5 cycle
. N/ m6 H7 s% v1 V/ \0 M12 cycles
7 J* `& u. y8 I& ?! m/ `" g6 L30 cycles
$ q9 D; @% q o* b' k; g# VIEC 61000-4-11& u! s7 i" {' H1 G. R0 B
Voltage change shall% R* G. l- `6 B! D4 l. i W! r
occur at zero crossing$ O/ k& t: x e( A! n0 a5 ?) L, A
UT is the rated voltage of the equipment under test.! {. G# E# W o! R( j; _* w2 r8 n
0 y1 R! q/ X7 P# _% F; r: u5 O9 S& _7 j9 K
CISPR 14-2 Amend. 2 © IEC:2008 – 5 –9 j( S8 z- j" n" x) x; M; }& N3 _
Page 27
- y# S: L L1 R3 z+ Q8 Conditions during testing
: v: g4 A, X# s* Z C1 u8.1 Replace the first paragraph by the following paragraph:8 v7 p" f# L( u
Unless otherwise specified, the tests shall be made while the apparatus is operated as1 P6 a2 K2 y) ~% \7 u
intended by the manufacturer, in the most susceptible operating mode consistent with normal
5 @ x8 x6 r5 ~3 E; `use.
8 b p- \- j( V% [6 d9 b8.4 Delete the second sentence.
' w% Y! [: ]( s k9 o8.7 Delete this subclause.
! a1 K- d' ~/ o3 ?8.8 Renumber this subclause as 8.79 [4 Z0 j1 d5 O
Page 29# z5 y' A2 d0 t7 u
9 Assessment of conformity+ R3 s8 E8 }3 V, v8 g/ _: {
9.2 Statistical evaluation" t% e" Z# B! f2 k8 n+ k+ ^' Y
Replace the existing Note by the following:
) p9 }4 v* d. O( l sNOTE For general information on the statistical consideration in the determination EMC compliance, see5 o3 B3 a' h7 q
CISPR/TR 16-4-3.
+ @7 H3 m) ^3 ?% ^Page 31
7 w: I2 e" x. i! |) Y0 [( z10 Product documentation+ l: c3 R" W0 \. A% g# t0 ^3 f7 q
Delete this clause./ e; e4 }1 \0 b& `8 b# Y
Bibliography% i$ k3 o& O) B/ a& b1 A' C1 z
Replace the reference to CISPR 16-2, introduced by Amendment 1, by the following reference:
# A }7 U: r1 f1 {% kCISPR/TR 16-4-3, Specification for radio disturbance and immunity measuring apparatus and
# b! {+ h. r$ h0 S& k9 Emethods – Part 4-3: Uncertainties, statistics and limit modelling – Statistical considerations in
, w; g7 R2 K" R5 T7 `the determination of EMC compliance of mass-produced products (only available in English) |
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